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Procurement Notice Details
Supply and maintenance of a dual beam plasma focused ion beam — field emission scanning electron microscope (pfib — sem)[amendment]
Petten, The Netherlands
Purchaser: European Commission, JRC — Joint Research Centre, JRC.G
Website link:
http://www.nuclearmarket.com/proc/msk.cfm?id=82926
07/06/2019 S109 European Commission - Supplies - Additional information - Open procedure I.II.VI.VII. Netherlands-Petten: NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
2019/S 109-264184
Corrigendum
Notice for changes or additional information
Supplies
(Supplement to the Official Journal of the European Union, 2019/S 105-254383)
Legal Basis:
Regulation (EU, Euratom) No 2018/1046 Section I: Contracting authority/entity
I.1) Name and addresses European Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness Westerduinweg 3 Petten 1755 LE Netherlands Contact person: Aneta Jukneviciene E-mail: jrc-ptt-procurement@ec.europa.eu NUTS code: NL328 Internet address(es):
Main address: https://ec.europa.eu/jrc/
Section II: Object
II.1) Scope of the procurement II.1.1) Title: NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)
Reference number: JRC/PTT/2019/OP/1257 II.1.2) Main CPV code 38510000 II.1.3) Type of contract Supplies II.1.4) Short description: In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.
Section VI: Complementary information
VI.5) Date of dispatch of this notice: 04/06/2019 VI.6) Original notice reference Notice number in the OJ S: 2019/S 105-254383 Section VII: Changes
VII.1) Information to be changed or added VII.1.2) Text to be corrected in the original notice Section number: I.3) Place of text to be modified: Communication Instead of: The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716
Additional information can be obtained from the abovementioned address
Tenders or requests to participate must be submitted electronically via: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716
Tenders or requests to participate must be submitted to the abovementioned address
Read: The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716
Additional information can be obtained from the abovementioned address.
Tenders or requests to participate must be submitted as stated in the procurement documents.
VII.2) Other additional information: Due to a clerical error tenders cannot be submitted electronically. Please refer to the revised invitation to tender letter at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716
On how to submit the tender.
http://ted.europa.eu/, TED database, © European Communities, 1995-2019.
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