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Procurement Notice Details

Supply and maintenance of a dual beam plasma focused ion beam — field emission scanning electron microscope (pfib — sem)[amendment]
Petten, The Netherlands

07/06/2019 S109 European Commission - Supplies - Additional information - Open procedure
I.II.VI.VII.
Netherlands-Petten: NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)

2019/S 109-264184

Corrigendum

Notice for changes or additional information

Supplies

(Supplement to the Official Journal of the European Union, 2019/S 105-254383)

Legal Basis:

Regulation (EU, Euratom) No 2018/1046
Section I: Contracting authority/entity

I.1)
Name and addresses
European Commission, JRC — Joint Research Centre, JRC.G — Nuclear Safety and Security (Karlsruhe), JRC.G.I.4 — Nuclear Reactor Safety and Emergency Preparedness
Westerduinweg 3
Petten
1755 LE
Netherlands
Contact person: Aneta Jukneviciene
E-mail: jrc-ptt-procurement@ec.europa.eu
NUTS code: NL328
Internet address(es):

Main address: https://ec.europa.eu/jrc/

Section II: Object

II.1)
Scope of the procurement
II.1.1)
Title:
NL-Petten: Supply and Maintenance of a Dual Beam Plasma Focused Ion Beam — Field Emission Scanning Electron Microscope (pFIB — SEM)

Reference number: JRC/PTT/2019/OP/1257
II.1.2)
Main CPV code
38510000
II.1.3)
Type of contract
Supplies
II.1.4)
Short description:
In order to perform in-situ large area contamination-free sample preparation and high resolution imaging and analysis, the JRC Petten plans to purchase a Dual Beam microscope (pFIB-SEM) featuring an inductively coupled plasma as ion beam source (pFIB) and a field emission electron beam as source for electron imaging. The pFIB/SEM infrastructure will support scientific activities in nuclear safety and in medical applications of nuclear science. For that purpose, the system will include energy dispersive x-ray (EDX), electron backscatter diffraction (EBSD) and scanning-transmission electron microscope (STEM) detectors and allow micromachining of micromechanical specimens, TEM lamellae preparation of metals and biological materials, and 3D reconstructions of inorganic materials and cells.

Section VI: Complementary information

VI.5)
Date of dispatch of this notice:
04/06/2019
VI.6)
Original notice reference
Notice number in the OJ S: 2019/S 105-254383
Section VII: Changes

VII.1)
Information to be changed or added
VII.1.2)
Text to be corrected in the original notice
Section number: I.3)
Place of text to be modified: Communication
Instead of:
The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Additional information can be obtained from the abovementioned address

Tenders or requests to participate must be submitted electronically via: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Tenders or requests to participate must be submitted to the abovementioned address

Read:
The procurement documents are available for unrestricted and full direct access, free of charge, at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

Additional information can be obtained from the abovementioned address.

Tenders or requests to participate must be submitted as stated in the procurement documents.

VII.2)
Other additional information:
Due to a clerical error tenders cannot be submitted electronically. Please refer to the revised invitation to tender letter at: https://etendering.ted.europa.eu/cft/cft-display.html?cftId=4716

On how to submit the tender.



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